DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-in

CHIEN-MO LIW.-C. KaoW.-S. ChuangH.-T. LinJ. C.-M. LiV, ManquinhoManquinhoVCHIEN-MO LI2018-09-102018-09-102010-03http://scholars.lib.ntu.edu.tw/handle/123456789/359581[SDGs]SDG7DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-injournal article10.1109/TVLSI.2008.20110482-s2.0-77649185652WOS:000274995400005