Stress-induced hump effects of p-channel polycrystalline silicon thin-film transistors

CHEE-WEE LIUHuang, C.-F.C.-F.HuangPeng, C.-Y.C.-Y.PengYang, Y.-J.Y.-J.YangSun, H.-C.H.-C.SunChang, H.-C.H.-C.ChangKuo, P.-S.P.-S.KuoChang, H.-L.H.-L.ChangLiu, C.-Z.C.-Z.LiuCHEE-WEE LIU2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-57049096959&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/341142[SDGs]SDG7Stress-induced hump effects of p-channel polycrystalline silicon thin-film transistorsjournal article10.1109/LED.2008.2007306