Mapping the three-dimensional stress distribution of GaN-based light emitting diode with confocal Raman and photoluminescence spectromicroscope

H.-Y. ChengW.-L. ChenY.-H. HuangT.-C. LuY.-M. Chang2020-06-112020-06-112015http://www.ntu-ccms.ntu.edu.tw/lab/ultrafast/index.htmhttps://scholars.lib.ntu.edu.tw/handle/123456789/501598June 30 – July 3, 2015, Nantou, TaiwanMapping the three-dimensional stress distribution of GaN-based light emitting diode with confocal Raman and photoluminescence spectromicroscopeposter