Oxide roughness effect on tunneling current of MOS diodes

Hsu, B.-C.B.-C.HsuChen, K.-F.K.-F.ChenLai, C.-C.C.-C.LaiLee, S.W.S.W.LeeLiu, C.W.C.W.Liu2009-03-252018-07-062009-03-252018-07-062002http://ntur.lib.ntu.edu.tw//handle/246246/148180application/pdf321671 bytesapplication/pdfen-USOxide roughness effect on tunneling current of MOS diodesjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/148180/1/29.pdf