Jump Scan: A DFT Technique for Low Power Testing,

CHIEN-MO LIM.H. ChiuCHIEN-MO LI2018-09-102018-09-102005-05http://scholars.lib.ntu.edu.tw/handle/123456789/318035Jump Scan: A DFT Technique for Low Power Testing,conference paper10.1109/vts.2005.512-s2.0-84886493168