Modeling and characterization of hydrogen-induced charge loss in nitride-trapping memory

JENN-GWO HWU2018-09-102018-09-102007http://www.scopus.com/inward/record.url?eid=2-s2.0-34249932782&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/329944Modeling and characterization of hydrogen-induced charge loss in nitride-trapping memoryjournal article10.1109/TED.2007.895242