Electromigration-induced grain rotation in anisotropic conducting beta tin

Wu A.T.Gusak A.M.Tu K.N.C. ROBERT KAO2019-11-272019-11-27200500036951https://www.scopus.com/inward/record.uri?eid=2-s2.0-21344460702&doi=10.1063%2f1.1941456&partnerID=40&md5=994797174c94dc966bef3275f34bc2d1https://scholars.lib.ntu.edu.tw/handle/123456789/432713Electromigration-induced grain rotation in anisotropic conducting beta tinjournal article10.1063/1.19414562-s2.0-21344460702