Huang Y.-MLiou Y.-HLiu A.-CLin C.-CKuo H.-C.CHIEN-CHUNG LIN2022-04-252022-04-252021https://www.scopus.com/inward/record.uri?eid=2-s2.0-85120049152&partnerID=40&md5=c74a3eccab4f07b270c68d3986d04e6ahttps://scholars.lib.ntu.edu.tw/handle/123456789/607006We report a 3-in-1 mini-light emitting diode and combine ink-jet printing technique to achieve a full color in monolithic chip. Finally, make reliability test by low-temperature ALD technology at 2020 color gamut of red and green QDs during 300 hours reliability test under 50℃/50% RH condition. ? OSA 2021, ? 2021 The Author(s)Atomic layer depositionColorInk jet printingOrganic light emitting diodes (OLED)PassivationTemperatureALD technologyAtomic-layer depositionColor-light-emittingFull colorInk-jet printingLightemitting diodeLows-temperaturesMonolithic chipPrinting techniquesReliability testSemiconductor quantum dotsHigh-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodesconference paper2-s2.0-85120049152