2010-07-012024-05-17https://scholars.lib.ntu.edu.tw/handle/123456789/692621摘要：奈米有機材料經由表面化學處理，如高能質子束或氣體電漿法，局部性調控其物理和化學性質，並經由掃描式光電子能譜顯微術(SPEM)和顯像式光電子能譜顯微術(PEEM)的分析，將探討奈米材料所特有的X光能譜，並藉由其空間解析的能力，來辨別其不同化學結構及電子結構之表面圖形分布，並找出界面上分子排列方向性，及利用圓偏振光二向性(XMCD)原理，來量測磁性材料之磁區顯影，並加以探討有機半導體分子的磁性電阻特性，來增加奈米自旋電子材料的應用價值。<br> Abstract: Energetic proton beam and gaseous plasma are used to locally manipulate the physical and chemical properties of organic materials for the purpose of artificial modification. With the help of scanning photoelectron microscopy (SPEM) and photoemission electron microscopy (PEEM), we can individually discuss the electronic structure and its modified pattern of nano-materials system on a space-resolved base. Using a linearly polarized X-ray light, we study the information of orientation of organic molecule on the surface due to the chemical treatment. The X-ray absorption intensity dependent on the circular polarized light, the so-called X-ray magnetic circular dichroism, can reveal the ferromagnetic domain image for different elements. Furthermore, the magnetic resistance of semiconducting molecule in organic junction systems can be found its particular behavior for the application of spintronics devices.奈米材料表面磁學有機自旋電子系統X光能譜學表面與介面科學電子結構表面化學調控Nano-materials systemsurface magnetismorganic spintronicsX-ray spectromicroscopysurface and interfacial scienceelectronic structurechemical treatment