Modeling Hot-Carrier-Induced Reliability of Poly-silicon Thin Film Transistors

L. L. WangJ. B. KuoS. ZhangJAMES-B KUO2018-09-102018-09-102012-12http://scholars.lib.ntu.edu.tw/handle/123456789/373978Modeling Hot-Carrier-Induced Reliability of Poly-silicon Thin Film Transistorsconference paper10.1109/EDSSC.2012.64827982-s2.0-84875692826