Raman microprobe spectroscopy of low-pressure-grown 4H-SiC epilayers

Tin, C.C.C.C.TinHu, R.R.HuLiu, J.J.LiuVohra, Y.Y.VohraFeng, Z.C.Z.C.Feng2010-09-022018-07-052010-09-022018-07-051996-01http://ntur.lib.ntu.edu.tw//handle/246246/193689en-USRaman microprobe spectroscopy of low-pressure-grown 4H-SiC epilayersjournal article