Radiation Effects on the Oxide Properties of Silicon MOS Capacitor

胡振國Lee, G. S.G. S.LeeJeng, M. J.M. J.Jeng王維新李嗣涔Hwu, Jenn-GwoJenn-GwoHwuWang, Way-SeenWay-SeenWangLee, Si-ChenSi-ChenLee2009-04-272018-07-062009-04-272018-07-061986http://ntur.lib.ntu.edu.tw//handle/246246/154401en-USRadiation Effects on the Oxide Properties of Silicon MOS Capacitorconference paper