Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

SSU-YEN HUANGLiang, J.J.J.J.LiangHsu, S.Y.S.Y.HsuLin, L.K.L.K.LinTsai, T.C.T.C.TsaiLee, S.F.S.F.Lee2018-09-102018-09-102011http://www.scopus.com/inward/record.url?eid=2-s2.0-79951513693&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/363105Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurementjournal article10.1140/epjb/e2010-10051-y2-s2.0-79951513693