Interdisciplinary characterization of sandwiched SiGe thin layers grown by molecular beam epitaxy

Feng, Z.C.Z.C.FengWatt, F.F.WattLee, K.K.K.K.LeeWee, A.T.S.A.T.S.WeeHng, H.H.H.H.HngArbet-Engels, V.V.Arbet-EngelsKarunasiri, R.P.G.R.P.G.KarunasiriWang, K.L.K.L.WangWilliam, K.P.J.K.P.J.William2010-09-022018-07-052010-09-022018-07-051995-01http://ntur.lib.ntu.edu.tw//handle/246246/193682en-USInterdisciplinary characterization of sandwiched SiGe thin layers grown by molecular beam epitaxyjournal article10.1109/EDMS.1994.863768