Evidence of SiSiGe heterojunction roughness scattering

CHEE-WEE LIULiu, C.W.C.W.LiuLee, M.H.M.H.LeeLee, Y.C.Y.C.LeeChen, P.S.P.S.ChenYu, C.-Y.C.-Y.YuWei, J.-Y.J.-Y.WeiMaikap, S.S.MaikapCHEE-WEE LIU2018-09-102018-09-102004http://www.scopus.com/inward/record.url?eid=2-s2.0-19144372900&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/309374Evidence of SiSiGe heterojunction roughness scatteringjournal article10.1063/1.1828224