Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction

Sun, W.C.W.C.SunChang, H.C.H.C.ChangWu, B.K.B.K.WuChen, Y.R.Y.R.ChenChu, C.H.C.H.ChuChang, S.L.S.L.ChangMINGHWEI HONGTang, M.T.M.T.TangStetsko, Y.P.Y.P.Stetsko2019-12-272019-12-272006https://scholars.lib.ntu.edu.tw/handle/123456789/443453Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffractionjournal article10.1063/1.23450232-s2.0-33748253659https://www.scopus.com/inward/record.uri?eid=2-s2.0-33748253659&doi=10.1063%2f1.2345023&partnerID=40&md5=c57513e5ed02667a5aca7967433e844c