High thermal stability of 850 nm VCSELs with enhanced mask margin up to 85 °c for 100G-SR4 Operation

Cheng H.-TYang Y.-CCHAO-HSIN WU2023-06-092023-06-092021https://www.scopus.com/inward/record.uri?eid=2-s2.0-85123427527&doi=10.1109%2fWOCC53213.2021.9603055&partnerID=40&md5=87bc7e4c8faefcb285bf0fbec5f5d765https://scholars.lib.ntu.edu.tw/handle/123456789/632228This paper presents a comprehensive analysis of the static and microwave characteristics, eye diagrams and eye margins of our 850 nm VCSELs over an extended wide temperature range from 25 to 85 °C. We investigate and discuss the key device parameters of VCSELs to offer a high mask margin for 100G-SR4 modules over a wide operating temperature range. © 2021 IEEE.85 °C VCSEL; 850 nm VCSELs; eye diagram; mask margin; vertical-cavity surface-emitting laserThermodynamic stability; Transceivers; 85 °C VCSEL; 850 nm VCSEL; Comprehensive analysis; Device parameters; Eye diagrams; High thermal stability; Mask margin; Microwave characteristics; Static characteristic; Wide temperature ranges; Surface emitting lasersHigh thermal stability of 850 nm VCSELs with enhanced mask margin up to 85 °c for 100G-SR4 Operationconference paper10.1109/WOCC53213.2021.96030552-s2.0-85123427527