Process Dependency of Radiation Hardness of Rapid Thermal Reoxidized Nitrided Gate Oxides

JENN-GWO HWU2018-09-102018-09-101993http://www.scopus.com/inward/record.url?eid=2-s2.0-0027656851&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/301816[SDGs]SDG6Process Dependency of Radiation Hardness of Rapid Thermal Reoxidized Nitrided Gate Oxidesjournal article10.1109/16.231564