Efficaciously Modeling Exterior Electrostatic Problems with Singularity for Electron Devices

Liao, Y.S.Y.S.LiaoChyuan, S,W.S,W.ChyuanChen, J.T.J.T.ChenLiaoYS2008-11-262018-06-282008-11-262018-06-282004http://ntur.lib.ntu.edu.tw//handle/246246/86964application/pdf877674 bytesapplication/pdfen-USEfficaciously Modeling Exterior Electrostatic Problems with Singularity for Electron Devicesjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/86964/1/35.pdf