An investigation on barrier inhomogeneities of 4H-SiC Schottky barrier diodes induced by surface morphology and traps

Lee, K.-Y.K.-Y.LeeHuang, Y.-H.Y.-H.HuangLee, Kung-YenKung-YenLeeHuang, Yan-HaoYan-HaoHuangKUNG-YEN LEE2018-09-102018-09-102012http://www.scopus.com/inward/record.url?eid=2-s2.0-84862820836&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/369302An investigation on barrier inhomogeneities of 4H-SiC Schottky barrier diodes induced by surface morphology and trapsjournal article10.1109/TED.2011.2181391