Zih-Chun SuYao-Han DongChing-Fuh Lin2024-08-092024-08-092024-06https://scholars.lib.ntu.edu.tw/handle/123456789/720165Hot-Carrier Effect and Nanometer Metal Enabling Si-Based Mid-Infrared Detection Beyond 5μm of Wavelengthjournal article10.1109/jphot.2024.3395982