Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates

Ejeckam, FEFEEjeckamChua, CLCLChuaZhu, Z-HZ-HZhuLo, YHYHLoMINGHWEI HONGMannaerts, JPJPMannaertsBhat, RiteshRiteshBhat2018-09-102018-09-101996http://scholars.lib.ntu.edu.tw/handle/123456789/323242Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substratesconference paper