Characterization of 1/f noise vs. number of gate stripes in MOS transistors

ChenHsin-ShuItoAkiraHSIN-SHU CHEN2018-09-102018-09-101999http://www.scopus.com/inward/record.url?eid=2-s2.0-0032738969&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/350035Characterization of 1/f noise vs. number of gate stripes in MOS transistorsconference paper