Lu, Shih-ChunShih-ChunLuChen, Yin-HuaYin-HuaChenTuan, Wei-HsingWei-HsingTuanTZONG-LIN JAY SHIEHChen, Chin-YiChin-YiChen2012-10-242018-06-282012-10-242018-06-282010https://www.scopus.com/record/display.uri?eid=2-s2.0-77953957736&origin=resultslist&sort=plf-f&src=s&sid=d4c4533ed6c68becc548af09f98a1875&sot=b&sdt=b&s=TITLE-ABS-KEY%28Effect+of+microstructure+on+dielectric+and+fatigue+strengths+of+BaTiO3%29&sl=85&sessionSearchId=d4c4533ed6c68becc548af09f98a1875&relpos=2en-USjournal article10.1016/j.jeurceramsoc.2010.04.0282-s2.0-77953957736http://ntur.lib.ntu.edu.tw/bitstream/246246/243855/-1/299.pdf