Correlation of carrier lifetimes and arsenic-antisite defects in LT-GaAs grown at different substrate temperatures

Lin, Gong-RuGong-RuLinLiu, Tze-AnTze-AnLiuPan, Ci-LingCi-LingPanGONG-RU LIN2018-09-102018-09-101999http://www.scopus.com/inward/record.url?eid=2-s2.0-0032596931&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/350191Correlation of carrier lifetimes and arsenic-antisite defects in LT-GaAs grown at different substrate temperaturesconference paper