Cell-based interconnection network design and the all-pairs examination problem

JA-LING WU2018-09-102018-09-101989http://www.scopus.com/inward/record.url?eid=2-s2.0-0024746155&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/348155A systematic procedure for the design of VLSI cell-based interconnection networks is proposed through the concept of the all-pairs examination problem. Since there are no line intersections between the intermodular interconnections of the proposed network, it is very suitable for planar VLSI implementation. © 1989 Taylor & Francis Ltd.application/pdf340253 bytesapplication/pdfAll-Pairs Examination Problem; Cell-Based Interconnection Network Design; Merging Process; Planar VLSI; Switching Functions; Integrated Circuits, VLSI; article; electronicsCell-based interconnection network design and the all-pairs examination problemjournal article10.1080/002072189089211042-s2.0-0024746155