Fabrication and characterization of quantum Hall devices for the resistance standard at CMS

Huang, C.F.C.F.HuangCHI-TE LIANGHang, D.R.D.R.HangYUAN-HUEI CHANGHuang, C.-Y.C.-Y.HuangChen, S.-F.S.-F.ChenLin, L.-H.L.-H.LinHsiao, J.C.J.C.HsiaoLin, T.-L.T.-L.LinCheng, K.A.K.A.Cheng2018-09-102018-09-102010http://www.scopus.com/inward/record.url?eid=2-s2.0-77956638848&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/355452Fabrication and characterization of quantum Hall devices for the resistance standard at CMSconference paper10.1109/CPEM.2010.55441752-s2.0-77956638848