Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions

Shin-Yann HoShuo-Ren LinKo-Lung YuanChien-Yen KuoKuan-Yu LiaoJie-Hong R. JiangChien-Mo James LiJIE-HONG JIANG2018-09-102018-09-102013-11http://scholars.lib.ntu.edu.tw/handle/123456789/381732Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functionsconference paper