Probing weak localization in chemical vapor deposition graphene wide constriction using scanning gate microscopy

Chuang, C.C.ChuangMatsunaga, M.M.MatsunagaLiu, F.-H.F.-H.LiuWoo, T.-P.T.-P.WooAoki, N.N.AokiLin, L.-H.L.-H.LinWu, B.-Y.B.-Y.WuOchiai, Y.Y.OchiaiCHI-TE LIANGTAK-PONG WOO2019-12-272019-12-272016https://scholars.lib.ntu.edu.tw/handle/123456789/442014Probing weak localization in chemical vapor deposition graphene wide constriction using scanning gate microscopyjournal article10.1088/0957-4484/27/7/0756012-s2.0-84955506742https://www.scopus.com/inward/record.uri?eid=2-s2.0-84955506742&doi=10.1088%2f0957-4484%2f27%2f7%2f075601&partnerID=40&md5=f7f46b9fe86c22d56ce09c0f2102c39e