Role of oxide charges on the voltage and current coupling effects between adjacent devices examined by concentric metal-insulator-semiconductor (MIS) tunnel diodes with ultra-thin oxide

Chi-Yi KaoSung-Wei HuangHui-Xin ShihWei-Cheng LinSin-Yong FengJenn-Gwo Hwu2024-11-082024-11-082024-09-30https://scholars.lib.ntu.edu.tw/handle/123456789/722895Role of oxide charges on the voltage and current coupling effects between adjacent devices examined by concentric metal-insulator-semiconductor (MIS) tunnel diodes with ultra-thin oxidejournal article10.1088/1402-4896/ad7cd6