Full-field microsurface profilometry using image correlation without vertical scanning

Wu, G.-W.G.-W.WuNguyen, D.T.D.T.NguyenChen, L.-C.L.-C.ChenLIANG-CHIA CHEN2020-01-132020-01-132019https://scholars.lib.ntu.edu.tw/handle/123456789/447815[SDGs]SDG3[SDGs]SDG9Full-field microsurface profilometry using image correlation without vertical scanningjournal article10.1364/OL.44.0035342-s2.0-85069616578https://www.scopus.com/inward/record.uri?eid=2-s2.0-85069616578&doi=10.1364%2fOL.44.003534&partnerID=40&md5=b4858d047185968cf1c83f8ab250361b