李建模臺灣大學：電子工程學研究所林鴻貿Lin, Hung-MaoHung-MaoLin2007-11-272018-07-102007-11-272018-07-102005http://ntur.lib.ntu.edu.tw//handle/246246/57346在本論文中，新的內建自我測試診斷技術被用於診斷多掃描鏈環境下之多重錯誤。在此技術中，每次掃描鏈輸出一組數據時，線性反饋移位暫存器會遮蔽部分數據。沒被遮蔽的數據，便被用於產生一組行奇偶與一組列奇偶。在每組掃描鏈數據輸出時，一個列奇偶便被產生。在簽名輸出時，行奇偶便被輸出。此技術也支援決定診斷。此技術在沒有未知數出現時，可以完全正確地診斷出錯誤所在點。而在有百分之一未知數出現情況下，此技術仍可以正確診斷出錯誤值地點。而此技術所需要的成本，只包含多餘的面積和額外的輸出接腳。In this thesis, a BIST diagnosis technique is presented to diagnose multiple errors in multiple scan chains. An LFSR randomly selects outputs of multiple scan chains every scan cycle. The column parity and row parity of the selected scan outputs are observed every scan cycle and every scan unload, respectively. The deterministic diagnosis of multiple scan chain is also supported. In the absence of unknowns, CPRS correctly diagnoses all errors within 15 diagnosis sessions. Compared with other techniques, which diagnose no more than 15% errors, CPRS correctly diagnoses all errors in the presence of 1% unknowns. The cost of this technique is area overhead and one additional output observed every scan cycle.摘要 I 誌謝 II Abstract III Acknowledge IV TABLE OF CONTENT V LIST OF FIGURE VII LIST OF TABLE VIII Chapter 1. Introduction 1 1.1 Motivation 1 1.2 CPRS 2 1.3 Contributions 3 1.4 Organization 4 Chapter 2. Background 5 2.1 Past research in BIST Diagnosis 5 2.1.1 Software category 5 2.1.2 Hardware category 5 2.2 Related work 8 2.2.1 Row and Column Parities 8 2.2.2 LFSR based random selection 10 Chapter 3. CPRS Diagnosis 12 3.1 Hardware Architecture 12 3.2 Diagnosis Flow 13 3.2.1 Random Diagnosis 13 3.2.2 Deterministic Diagnosis 15 3.3. Calculation Methods 15 3.3.1 Calculate Error Bits 15 3.3.2 RS-LFSR Seed Calculation 20 Chapter 4. Software Implementation 24 4.1 Generate SM, ECP, ERP, RSEM, and linear equations 24 4.1.1 Generate SM 24 4.1.2 Generate ECP, ERP 27 4.1.3 Generate RSEM 28 4.1.4 Generate Linear equations 30 4.2 Solve EM: Modulo-2 Gauss-Jordan elimination 32 4.3 Solve RS-LFSR seed using DSM 34 Chapter 5. Experiment Results 36 5.1 Total flow 36 5.2 Diagnosis without X 38 5.3 Diagnosis with X 41 Chapter 6. Discussions and Future work 44 6.1 Discussions 44 6.1.1 Hardware Overhead 44 6.1.2 Failing Pattern Identification 45 6.2 Future work 46 6.2.1 Probability analysis 47 6.2.2 DSM 47 6.2.3 BIST controller 48 Chapter 7. Summary 49 References 50en-US行奇偶列選擇多掃描鏈多重錯誤內建自我測試診斷Column ParityRow SelectionCPRSBISTDiagnosisMultiple ErrorsMultiple Scan Chainsthesis