Lin Y.-C.Chen Y.-C.Hsieh H.-I.PAU-CHUNG CHEN2022-03-312022-03-3120151010-5395https://www.scopus.com/inward/record.uri?eid=2-s2.0-84926352714&doi=10.1177%2f1010539513490788&partnerID=40&md5=336f5b467424c108248f92ac42548fcahttps://scholars.lib.ntu.edu.tw/handle/123456789/602898Risk for work-related fatigue among the employees on semiconductor manufacturing linesjournal article10.1177/1010539513490788237615902-s2.0-84926352714