Charge-based capacitance measurement for bias-dependent capacitance

YAO-WEN CHANGChang, H.-W.H.-W.ChangLu, T.-C.T.-C.LuKing, Y.-C.Y.-C.KingTing, W.W.TingKu, Y.-H.J.Y.-H.J.KuLu, C.-Y.C.-Y.Lu2018-09-102018-09-102006http://www.scopus.com/inward/record.url?eid=2-s2.0-33646236910&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/324063Charge-based capacitance measurement for bias-dependent capacitancejournal article10.1109/LED.2006.8733682-s2.0-33646236910WOS:000237602300026