Reliability screening of a-Si TFT circuits: Very-low voltage and I <inf>DDQ</inf> Testing

Shen, S.-T.S.-T.ShenLiu, C.C.LiuMa, E.-H.E.-H.MaCheng, I.-C.I.-C.ChengLi, J.C.-M.J.C.-M.LiI-CHUN CHENGCHIEN-MO LI2018-09-102018-09-102010http://www.scopus.com/inward/record.url?eid=2-s2.0-78449309721&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/357983Reliability screening of a-Si TFT circuits: Very-low voltage and I <inf>DDQ</inf> Testingjournal article10.1109/JDT.2010.20604692-s2.0-78449309721