Robust test pattern generation for hold-time faults in nanometer technologies

Ho, Y.-H.Y.-H.HoChen, Y.-W.Y.-W.ChenChang, C.-M.C.-M.ChangYang, K.-C.K.-C.YangCHIEN-MO LI2020-06-292020-06-292017https://scholars.lib.ntu.edu.tw/handle/123456789/505984Robust test pattern generation for hold-time faults in nanometer technologiesconference paper10.1109/VLSI-DAT.2017.79396472-s2.0-85021456154https://www.scopus.com/inward/record.uri?eid=2-s2.0-85021456154&doi=10.1109%2fVLSI-DAT.2017.7939647&partnerID=40&md5=c19cc85f9bd6837e1c5de0e362f1f1a5