Diagnosis of Resistive-Open and Stuck-Open Defects in Digital CMOS ICs

Li, James Chien-MoJames Chien-MoLiMcCluskey, Edward J.Edward J.McCluskey2009-03-112018-07-062009-03-112018-07-062005http://ntur.lib.ntu.edu.tw//handle/246246/144072application/pdf326658 bytesapplication/pdfen-USDiagnosis of Resistive-Open and Stuck-Open Defects in Digital CMOS ICsjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/144072/1/06.pdf