otational positioning system adapted to atomic force microscope for measuring anisotropic surface properties

Liao, H.-S.H.-S.LiaoJuang, B.-J.B.-J.JuangChang, W.-C.W.-C.ChangLai, W.-C.W.-C.LaiHuang, K.-Y.K.-Y.HuangChang, C.-S.C.-S.ChangLiaoHSHuangKY2012-10-312018-06-282012-10-312018-06-282011http://ntur.lib.ntu.edu.tw//handle/246246/244089en-USotational positioning system adapted to atomic force microscope for measuring anisotropic surface propertiesjournal article10.1063/1.3664617http://ntur.lib.ntu.edu.tw/bitstream/246246/244089/-1/161.pdf