國立臺灣大學電子工程學研究所陳逸任黃俊郎Chen, Yi-RenYi-RenChenHuang, Jiun-LangJiun-LangHuang2006-09-272018-07-102006-09-272018-07-102005-02http://ntur.lib.ntu.edu.tw//handle/246246/2006092712273575777類比／混合信號系統的可測試性設計技術由於缺乏 有效的評估方法，接受度一直不高。在這篇論文中，我們 提出一個評估可測試性設計效能的技術。該方法考慮無可 避免的製程偏移對待測電路與可測試性電路性能的影 響，因此比過去的方法更為實際，也更能反映出實際生產 線上的製程缺陷。我們以一個內含Ramp Generator 可測試 性設計的Flash ADC 為例，分析的結果發現原來的可測試 性設計並不能偵測到動態缺陷， 必須重新設計Ramp Generator。One of the hurdles that prevent the wide acceptance of analog/mixed-signal design-for-test techniques is lack of a realistic and practical evaluation methodology. In this paper, a method to assess the quality of a design-for-test design (together with the associated test set) is proposed. Based on fabrication process variation information, our design-for-test evaluation criterion considers the inevitable adverse effects of fabrication process imperfection on both the functional and design-for-test circuits, and therefore will correlate better with the manufacturing test quality than past proposals. To validate our method, a flash ADC with a built-in ramp generator is used as an ex-ample. The proposed approach shows that the original designfor- test design fails capturing dynamic defects, and a redesign of the ramp generator or the test set is necessary to enhance the manufacturing test quality.application/pdf276633 bytesapplication/pdfzh-TW可測試性設計混合信號電路測試類比／數位 轉換器積分非線性錯誤微分非線性錯誤design-for-testmixed-signal testinganalogto- digital converterINLDNLjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/2006092712273575777/1/n93-8.pdf