A New Fitting Method for Ambipolar Diffusion Length Extraction in Thin Film Structures Using Photoluminescence Measurement with Scanning Excitation

Chu, C.-H.C.-H.ChuMao, M.-H.M.-H.MaoLin, Y.-R.Y.-R.LinMING-HUA MAOHAO-HSIUNG LIN2021-05-052021-05-052020https://www.scopus.com/inward/record.url?eid=2-s2.0-85082538621&partnerID=40&md5=d88660416c6fde8bf73fd3f04415affahttps://scholars.lib.ntu.edu.tw/handle/123456789/559116A New Fitting Method for Ambipolar Diffusion Length Extraction in Thin Film Structures Using Photoluminescence Measurement with Scanning Excitationjournal article10.1038/s41598-020-62093-w322513502-s2.0-85082538621WOS:000563390400013