Huang, Y.-C.Y.-C.HuangHsieh, H.-H.H.-H.HsiehLIANG-HUNG LU2020-06-112020-06-11200800189480https://scholars.lib.ntu.edu.tw/handle/123456789/498206https://www.scopus.com/inward/record.uri?eid=2-s2.0-44049093635&doi=10.1109%2fTMTT.2008.921293&partnerID=40&md5=c81b992574c2d6b552d8e6f0428ad7d9A built-in self-test (BIST) technique suitable for RF low-noise amplifiers (LNAs) is presented in this paper. With fully integrated amplitude detectors and logarithmic amplifiers, the BIST module can be employed as a generic platform for gain extraction of the device-under-test (DUT) without expensive testing instruments, while maintaining a reasonable hardware overhead and minimum loading effects to the DUT. Using a 0.18-μ m CMOS process, a 5-GHz variable-gain LNA with the proposed BIST module is implemented. Based on the experimental results, on-chip gain extraction of the LNA has been demonstrated with an error less than 1 dB for various gain modes. The additional chip area required for the BIST functionality measures 0.042 mm2, which is considerably small compared with the physical size of the RF amplifiers. © 2006 IEEE.Amplitude detectors; Built-in self-test (BIST); Logarithmic amplifiers; Low-noise amplifiers (LNAs); RF testing[SDGs]SDG7CMOS integrated circuits; Computer hardware; Gain control; Logarithmic amplifiers; Low noise amplifiers; Amplitude detectors; Device-under-test (DUT); RF testing; Built-in self testjournal article10.1109/TMTT.2008.9212932-s2.0-44049093635WOS:000256024400003