Lai, W.W.LaiKung, C.C.Kung林呈祥Lin, Chen-ShangChen-ShangLin2009-02-042018-07-062009-02-042018-07-061992-11http://ntur.lib.ntu.edu.tw//handle/246246/121609en-USTest Reduction in Scan-Designed Circuitsconference paper