Characterizing the thickness dependence of epitaxial GaN grown over GaN nanocolumns using X-ray diffraction

CHIH-CHUNG YANGShiao, W.-Y.W.-Y.ShiaoTang, T.-Y.T.-Y.TangChen, Y.-S.Y.-S.ChenAverett, K.L.K.L.AverettAlbrecht, J.D.J.D.AlbrechtCHIH-CHUNG YANG2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-44549085826&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/339010[SDGs]SDG15Characterizing the thickness dependence of epitaxial GaN grown over GaN nanocolumns using X-ray diffractionjournal article10.1016/j.jcrysgro.2008.04.006