Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy

Goncharenko, A.V.A.V.GoncharenkoDvoynenko, M.M.M.M.DvoynenkoChang, H.-C.H.-C.ChangWang, J.-K.J.-K.Wang2020-06-022020-06-02200600036951https://scholars.lib.ntu.edu.tw/handle/123456789/496491Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopyjournal article10.1063/1.2183362