Spectroscopic characterization of Ni films on sub-10-nm silica layers: Thermal metamorphosis and chemical bonding

Lee, Pei-HsuanPei-HsuanLeeChang, Che-ChenChe-ChenChang2009-09-092018-07-102009-09-092018-07-102007http://ntur.lib.ntu.edu.tw//handle/246246/164662application/pdf3028065 bytesapplication/pdfen-USSpectroscopic characterization of Ni films on sub-10-nm silica layers: Thermal metamorphosis and chemical bondingjournal article10.1016/j.susc.2006.10.030WOS:000244006200010http://ntur.lib.ntu.edu.tw/bitstream/246246/164662/1/15.pdf