Effects of iridium oxide thickness and post annealing temperature on the size and density of core-shell IrOx-based nanocrystals of a nonvolatile memory device

Li, W.C.W.C.LiYang, J.R.J.R.YangJER-REN YANG2020-05-122020-05-122011https://scholars.lib.ntu.edu.tw/handle/123456789/491578[SDGs]SDG7Effects of iridium oxide thickness and post annealing temperature on the size and density of core-shell IrOx-based nanocrystals of a nonvolatile memory deviceconference paper10.1149/1.36330272-s2.0-84863152956https://www.scopus.com/inward/record.uri?eid=2-s2.0-84863152956&doi=10.1149%2f1.3633027&partnerID=40&md5=b270659f518492c504de7d3bc76bbec0