指導教授：李建模臺灣大學：電子工程學研究所趙士閔Chao, Shih-MinShih-MinChao2014-11-302018-07-102014-11-302018-07-102014http://ntur.lib.ntu.edu.tw//handle/246246/263925這篇論文針對多重缺陷的錯誤晶片提出一個新的診斷技術，這個技術使用一個簡單的經驗法則來分割錯誤資訊，如此一來難以偵測的缺陷和容易偵測的缺陷很可能被分離，各個缺陷很有可能被獨自診斷。這個技術只需要在商業診斷軟體上加一個簡單的工具，不需要客製化的診斷軟體。模擬的實驗在基準電路上這個技術有效的提升診斷的準確度。業界的錯誤晶片實體故障分析驗證了我們診斷技術的正確性。This thesis presents a novel diagnosis technique for multiple defects. This technique proposes a simple heuristic to partition the failures log so that hard-to-detect defects and easy-to-detect defects are likely to be separated. Hopefully, each defect can be diagnosed individually. This technique requires only commercial diagnosis software with a simple add-on tool. No customized diagnosis software is needed. Simulations on benchmark circuits demonstrated the effectiveness of the proposed technique. Real silicon experiments on a real industrial product have been verified by physical failure analysis.Chapter 1 Introduction 1 1.1 Motivation 1 1.2 Proposed Techniques 3 1.3 Contributions 6 1.4 Organization 6 Chapter 2 Background 7 2.1 Prior Work in Multiple Defect Diagnosis 7 2.2 SLAT Diagnosis 9 2.3 SLIC Diagnosis 11 2.4 Failing Output Partitioning 14 2.5 The Byzantine Effect 17 2.6 The Scoring System 19 Chapter 3 Proposed Techniques 22 3.1 Overall Flow 22 3.2 Failure Log Partition 24 3.3 Merge and Rank 27 3.4 UFO Partition Diagnosis 29 3.5 Score of a Die 31 Chapter 4 Experimental Results 35 4.1 Simulation Setup 36 4.2 Simulation Results 36 4.3 Silicon Experimental Results 39 4.4 Silicon Case Study 41 Chapter 5 Conclusion and Future Work 46 References 47697119 bytesapplication/pdf論文公開時間：2014/08/14論文使用權限：同意有償授權(權利金給回饋學校)診斷多重缺陷thesishttp://ntur.lib.ntu.edu.tw/bitstream/246246/263925/1/ntu-103-R01943145-1.pdf