Hsue, Ching-WenChing-WenHsueCHIH-JEN LIN2020-05-042020-05-041993https://scholars.lib.ntu.edu.tw/handle/123456789/488003Built-In Current Sensor for IDDQ Test in CMOS.conference paper10.1109/TEST.1993.470640https://doi.org/10.1109/TEST.1993.470640