Probing structural phase transitions of crystalline C60 via resistivity measurements of metal film overlayers

Chang, C.W.C.W.ChangRegan, B.C.B.C.ReganMickelson, W.W.MickelsonRitchie, R.O.R.O.RitchieZettl, A.A.Zettl2020-05-222020-05-22200300381098https://scholars.lib.ntu.edu.tw/handle/123456789/494300Probing structural phase transitions of crystalline C60 via resistivity measurements of metal film overlayersjournal article10.1016/j.ssc.2003.08.042