Modeling and simulation of TSV induced keep-out zone using silicon data

Liu, C.W.C.W.LiuYan, J.-Y.J.-Y.YanJan, S.-R.S.-R.JanCHEE-WEE LIU2020-06-162020-06-162016https://scholars.lib.ntu.edu.tw/handle/123456789/502111Modeling and simulation of TSV induced keep-out zone using silicon dataconference paper10.1109/ICSICT.2016.79989122-s2.0-85028657086https://www.scopus.com/inward/record.uri?eid=2-s2.0-85028657086&doi=10.1109%2fICSICT.2016.7998912&partnerID=40&md5=259390be779d82051ccb41247c1d980d